43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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INVITED: X-ray ptychography for chip-scale imaging
Wednesday, November 8, 2017: 3:30 PM
Ballroom C (Pasadena Convention Center)
Prof. A. F. J. Levi, Ph.D
,
University of Southern California, Los Angeles, CA
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Microscopy II
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Technical Program
