43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Neel Leslie: Visible vs IR for Laser Probing
Thursday, November 9, 2017: 1:40 PM
Ballroom D (Pasadena Convention Center)
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Contactless Optical/Nano-Probing EFA User Group
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Technical Program