Contactless Optical/Nano-Probing EFA User Group

Thursday, November 9, 2017: 12:20 PM-2:20 PM
Ballroom D (Pasadena Convention Center)
Ms. Sweta Pendyala, Globalfoundries, Nebojsa Jankovic, NXP Semiconductors and Mr. Dan Bockelman, Intel Corp.
12:20 PM
Daminda Dahanayaka: Challenges of FEOL sample preparation for Nano-probing of advance nodes
12:40 PM
Martin Von Haartman: Recent Advances in Nano-probing
1:00 PM
Brett Alder: Advantages of Electro-Optical voltage Probing (EOP) using a Digitizer
1:20 PM
Michael Bruce: Fault Localization – LTP Technique using High-Speed Digitizer vs. Oscilloscope
1:40 PM
Neel Leslie: Visible vs IR for Laser Probing
2:00 PM
Weston Hearne: Techniques for Successful Back End of Line Nanoprobing
See more of: Technical Program
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