43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): http://www.asminternational.org/web/istfa-2017/home

43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017

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Mr. Eric Barbian

Member of Technical Staff - Failure Analysis
ON Semiconductor
Quality
Phoenix, AZ
USA 85008

Papers:

Novel IC Device Repackaging for SIL and Backside Analysis Capability
ATPG Testing and Diagnosis Implementation for a Fast and Efficient Iterative ATPG Diagnosis and Fault Isolation

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General Information

November 05 - 09, 2017


Pasadena, CA