43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Mr. Thierry Parrassin
ST Microelectronics Crolles 2
EFA Design
Crolles France 38920
Papers:
STUDENT PAPER: Acceptable laser dose of 28 nm FDSOI technology - Correlation of experiment and simulation
