43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): http://www.asminternational.org/web/istfa-2017/home

43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017

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Dr. Lavakumar Ranganathan

Sr. Staff Eng./Mgr.
Qualcomm Technologies Inc.
San Diego, CA
USA 92121

Papers:

Laser Silicon Interaction Study on Ring Oscillators to establish Temperature Voltage Dependency trends on 14nm and future FinFET technologies.
Time Resolved LADA using a modulated pulsed laser to fault isolate bridging defects and framing high accuracy Physical FA plan in 14nm FinFET technologies.

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General Information

November 05 - 09, 2017


Pasadena, CA