43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): http://www.asminternational.org/web/istfa-2017/home

43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017

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Mr. Oskar Amster

Dir Sales and Marketing
PrimeNano, Inc.
Marketing
Santa Clara, CA
USA 95054

Papers:

Common and Novel AFM Techniques and Applications in Semiconductor Failure Analysis and High Resolution Device Characterization
Measurement of Dielectric constant and Doping Concentration of a Cross-sectioned Device by Quantitative Scanning Microwave Impedance Microscopy

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General Information

November 05 - 09, 2017


Pasadena, CA