43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Mr. Pierre-Olivier Autran
ESRF
Grenoble France 38000
Papers:
STUDENT PAPER: Making synchrotron tomography a routine tool for 3D integration failure analysis through a limited number of projections, an adapted sample preparation scheme, and a fully-automated post-processing