43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Arnaud Bousquet
GLOBALFOUNDRIES
Malta, NY
USA 12020
Papers:
Characterization of Gate Oxide Pinhole Defect in NMOS FinFET Devices
