Mr. Gaurav S. Mattey

Senior Engineer
Qualcomm Technologies, Inc.
QCT Failure Analysis
San Diego, CA
USA 92121

Papers:

Laser Silicon Interaction Study on Ring Oscillators to establish Temperature Voltage Dependency trends on 14nm and future FinFET technologies.
Time Resolved LADA using a modulated pulsed laser to fault isolate bridging defects and framing high accuracy Physical FA plan in 14nm FinFET technologies.