43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): http://www.asminternational.org/web/istfa-2017/home

43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index

Mr. Tim Schaffus

Infineon Technologies AG
Failure Analysis
Regensburg Germany 93049

Papers:

Influence of Sample Preparation on Intrinsic Stress inside a Model Chip, comparison of Results from Electric Read-Out and Raman Spectroscopy.

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index
General Information

November 05 - 09, 2017


Pasadena, CA