43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Dr. Tomonori Nakamura
Hamamatsu Photonics
hamamatsu Japan 431-3196
Papers:
STUDENT PAPER: Optical Investigations of Temperature Effects in 14/16 nm FinFETs
