Board and System Level FA - Poster

Wednesday, November 8, 2017: 1:30 PM-3:30 PM
Mr. Bhanu P. Sood, NASA Goddard Space Flight Center and Mr. Jason Wheeler, Raytheon
Case study of physical failure analysis method for micro crack detection in laser via of printed circuit boards
Mr. Hyunsoo Kim, QRT Inc.; Mr. Jaehyeong Woo, QRT Inc.; Mr. Dongju Lim, QRT Inc.; Mr. Youngje Kim, QRT Inc.; Mr. Mummo Jeong, QRT Inc.
Challenges of system level failure analysis of electronics in the automotive industry
Mr. Bence Hevesi, Robert Bosch Kft.
See more of: Technical Program
<< Previous Session | Next Session >>