FIB User Group

Thursday, November 9, 2017: 12:20 PM-2:20 PM
Ballroom E (Pasadena Convention Center)
Mr. Michael Wong, Thermo Fisher Scientific, Mr. Dane Scott, Intel Corporation and Mr. Steven B. Herschbein, GLOBALFOUNDRIES
12:20 PM
Adam Steele: Next-Gen FIB and SIMS with the Low Temperature Ion Source
12:40 PM
Sharang Sharang: Delayering Capabilities Using Xe Plasma FIB and Associated In-situ Measurements
1:00 PM
Michael DiBattista: A Decision Tree for FIB Sample Preparation Strategy
1:20 PM
Valery Ray: Quantifiable Comparative Testing Approach for Evaluating FIB/SEM Instruments
1:40 PM
Hideo Tanaka: Sub pico-Amp Focused Ion Beam (FIB) for Circuit Edit on FinFET Technology
2:00 PM
Richard H. Livengood: Neon GFIS Induced Chemical Assisted Etch and Beam Induced Deposition Characterization
See more of: Technical Program
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