STEM-in-SEM: From Basic Imaging to Rigorous Quantitative Analysis with Different Detectors

Sunday, October 28, 2018: 10:20 AM

226BC (Phoenix Convention Center)

Dr. Jason Holm , Natinoal Institute of Standards and Technology, Boulder, CO

Dr. Benjamin Caplins , Natinoal Institute of Standards and Technology, Boulder, CO

Dr. Robert Keller , Natinoal Institute of Standards and Technology, Boulder, CO

See more of: Microscopy I
See more of: Tutorial