Microscopy I

Sunday, October 28, 2018: 8:00 AM-11:50 AM
226BC (Phoenix Convention Center)
Ms. Susan Li, Cypress Semiconductor and Ms. Rose Ring, LAM Research
8:00 AM
Optical and infrared microscopy
Mr. John J. McDonald, Latigo Optics Inc.
9:00 AM
Review of Scanning Probe Microscopy (SPM) methods for Failure Analysis
Dr. Peter De Wolf, Bruker Nano Surfaces
10:00 AM
Morning Refreshment Break
10:20 AM
STEM-in-SEM: From Basic Imaging to Rigorous Quantitative Analysis with Different Detectors
Dr. Jason Holm, Natinoal Institute of Standards and Technology; Dr. Benjamin Caplins, Natinoal Institute of Standards and Technology; Dr. Robert Keller, Natinoal Institute of Standards and Technology
See more of: Tutorial
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