Thermal transient phenomenon analysis for design debug

Wednesday, October 31, 2018: 1:05 PM
225AB (Phoenix Convention Center)
Ms. Morgane Mousnier , Centre National d'Etudes Spatiales (CNES), Toulouse, France
Dr. Guillaume Bascoul , Centre National d'Etudes Spatiales (CNES), Toulouse, France
Mr. Thomas Lombardi , NXP semiconductor, Toulouse, France
Mr. Adrien Faure , NXP semiconductor, Toulouse, France
Mr. Julien Goxe , NXP semiconductor, Toulouse, France
Mr. Pierre Turpin , NXP semiconductor, Toulouse, France
Mr. Heinrich Kamamen , NXP semiconductor, Toulouse, France
Mr. Thomas Zirilli , NXP semiconductor, Toulouse, France
Mr. Vincent Bley , LAPLACE Laboratory, Toulouse, France
Mr. Thierry Lebey , LAPLACE Laboratory, Toulouse, France