Focused Ion Beam (FIB) for Chip Circuit Edit and Fault Isolation
Tuesday, October 30, 2018: 3:40 PM
226BC (Phoenix Convention Center)
Mr. Steven B. Herschbein
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Dr. Shida Tan
,
Intel Corporation, Santa Clara, NY
Mr. Carmelo F. Scrudato
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Richard H. Livengood
,
Intel Corporation, Santa Clara, NY
Mr. Edward S. Hermann
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Oleg Sidorov
,
Thermo Fisher Scientific, Hillsboro, NY
Mr. Dennis B. Melick
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Kyle M. Winter
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Raymond L. Wagner
,
GLOBALFOUNDRIES, Hopewell Junction, NY
