Microscopy III

Tuesday, October 30, 2018: 3:40 PM-5:10 PM
226BC (Phoenix Convention Center)
Ms. Susan Li, Cypress Semiconductor and Ms. Rose Ring, LAM Research
3:40 PM
Focused Ion Beam (FIB) for Chip Circuit Edit and Fault Isolation
Mr. Steven B. Herschbein, GLOBALFOUNDRIES; Dr. Shida Tan, Intel Corporation; Mr. Carmelo F. Scrudato, GLOBALFOUNDRIES; Mr. Richard H. Livengood, Intel Corporation; Mr. Edward S. Hermann, GLOBALFOUNDRIES; Mr. Oleg Sidorov, Thermo Fisher Scientific; Mr. Dennis B. Melick, GLOBALFOUNDRIES; Mr. Kyle M. Winter, GLOBALFOUNDRIES; Mr. Raymond L. Wagner, GLOBALFOUNDRIES
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