44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
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Chip Scale Packaging and Its Failure Analysis Challenges
Sunday, October 28, 2018: 8:00 AM
226A (Phoenix Convention Center)
Ms. Susan Li
,
Cypress Semiconductor, San Jose, CA
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Package and Physical Analysis Challenges I
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Tutorial