Prof. Yasuo Cho

Professor
Tohoku University
Research Institute of Electrical Communication
Sendai Japan 980-8577

Papers:

Quantitative imaging of carrier distribution in silicon solar cell using scanning nonlinear dielectric microscopy
High resolution mapping of subsurface defects at SiO2/SiC interfaces by time-resolved scanning nonlinear dielectric microscopy
Novel carrier measurement methodology for floating gate of sub-20 nm node flash memory using scanning nonlinear dielectric microscopy