44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
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Mr. Etienne Auvray
ST Microelectronics,
FA Lab manager
Grenoble Cedex France F-38019
Papers:
Use of analog simulation in failure analysis:Application to Emission microscopy and laser Voltage Probing techniques
