44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
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Elia Halteh
NVIDIA
Silicon Failure Analysis Lab
Santa Clara, CA
USA 95050
Papers:
Thermal Exposure Effects of Backside Thinned Flip-Chip Device on Visible Light Probing
