44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
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Mr. hoonyen gwee
Staff Engineer
Infineon Technologies
QM
Melacca Malaysia
Papers:
Special sample preparation methodology for Cu pillar bump characterization on Advance Thin Small Leadless (ATSLP) Flip Chip with Copper Pillar (CuP) Bump Interconnect technology