44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Dr. Oleg Mukhanov
Chief Technology Officer
HYPRES
Elmsford, NY
USA 10523
Papers:
Ambient Temperature Thermally Induced Voltage Alteration (TIVA) for Identification of Defects in Superconducting Electronics