Honghua Yang

Bruker Nano Surfaces
Santa Barbara, CA
USA 93117

Papers:

Characterizing interlayer sub-m features in microelectronics devices using high resolution scanning probe-IR spectroscopy and imaging
Successfully Look Up Table Distribution RAM (LUTRAM) Control Circuitry Fault Isolation with Different Test Methodologies and Conflict Results Analysis by Using Virtual IO (VIO) and Integrated Logic Analyzer (ILA) Debug Tools