44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
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Mr. Sukeshwar Kannan
3D Packaging Manager
Globalfoundries
Malta, NY
USA 12688
Papers:
Nanoscale 3D X-Ray Microscopy for high density Multi-Chip Packaging FA
