Detecting and Preventing Counterfeit Microelectronics

Tuesday, November 12, 2019: 11:40 AM-12:05 PM
F 150/151 (Oregon Convention Center)
Dr. Michael Azarian, CALCE, University of Maryland and Dr. Martine Simard-Normandin, MuAnalysis Inc.
11:40 AM
SIMS, Secondary Ion Mass Spectroscopy for counterfeit detection of Electrical, Electronic, and Electromechanical (EEE) parts.
Dr. Martine Simard-Normandin, MuAnalysis Inc.
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