Interpreting laser based fault localization results: Case study

Wednesday, November 13, 2019
Exhibit Hall D (Oregon Convention Center)
Mr. Sukho Lee , NXP Semiconductors, Nijmegen, Netherlands
Mr. John van den Biggelaar , NXP Semiconductors, Nijmegen, Netherlands
Dr. Marc van Veenhuizen , NXP Semiconductors, Nijmegen, Netherlands

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