Fault Isolation - POSTERS

Wednesday, November 13, 2019: 2:30 PM-4:30 PM
Exhibit Hall D (Oregon Convention Center)
Fault Isolation - POSTERS Mr. Dan Bodoh1, Dr. Jesse Alton2, Dr. Shraddha Bodhe3 and Ms. Lauren Blair3, (1)NXP Semiconductors(2)TeraView Limited(3)Advanced Micro Devices Ptd Ltd
Fast and Accurate Fault Localization Through Effective Use of Design Schematics
Mrs. Rupa Kamoji, Synopsys India Pvt. Ltd.; Dr. Ankush Oberai, Synopsys Inc; Mr. Arpan Bhattacherjee, Synopsys Inc
MBIST Driven SRAM Failure Analysis Using Laser Voltage Imaging and Laser Voltage Probing
Ms. Kaiyue Yang, Nvidia; Puneet Gupta, NVIDIA; Omprakash Rengaraj, Nvidia; Dr. Rudolf Schlangen, NVIDIA Corporation
Interpreting laser based fault localization results: Case study
Mr. Sukho Lee, NXP Semiconductors; Mr. John van den Biggelaar, NXP Semiconductors; Dr. Marc van Veenhuizen, NXP Semiconductors
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