Variable angle TEM grid holder for advanced TEM lamellae preparation

Tuesday, November 12, 2019: 1:25 PM
F 150/151 (Oregon Convention Center)
Dr. Tomas Hrncir , TESCAN Brno s.r.o., Brno, Czech Republic
Mr. Marek Sikula , TESCAN Brno s.r.o., Brno, Czech Republic
Dr. Pavel Dolezel , TESCAN Brno s.r.o., Brno, Czech Republic
Dr. Claudio A. G. Savoia , STmicroelectronics, Agrate Brianza, Italy

See more of: FIB Sample Preparation
See more of: Technical Program