Artifact-Free Decapsulation of Silver Wire Bonded Semiconductor Devices Using Microwave Induced Plasma

Thursday, November 14, 2019: 8:00 AM

F 150/151 (Oregon Convention Center)

Dr. Jiaqi Tang , JIACO Instruments, Delft, Netherlands

Mr. David Lohier , HIREX Engineering, Toulouse, France

Mr. Bertrand Forgerit , HIREX Engineering, Toulouse, France

Mr. Guillaume Gabaston , HIREX Engineering, Toulouse, France

Ms. Jing Wang , JIACO Instruments, Delft, Netherlands

Mr. Wilbert van den Hoek , JIACO Instruments, Delft, Netherlands

Prof. Kees Beenakker , Delft University of Technology, Delft, Netherlands