Modern 2D & 3D X-ray technologies for testing and failure analysis
Modern 2D & 3D X-ray technologies for testing and failure analysis
Wednesday, November 13, 2019
Exhibit Hall D (Oregon Convention Center)
Summary:
Modern 2D and 3D X-ray technologies are among the most useful non-destructive testing (NDT) methods that enable the inspection of an object’s internal features without cutting or disassembling the sample. The discovery of X-rays (Röntgen, 1895) marked a revolution that led to major advances in the fields of physics and medicine. Several X-ray based technologies began in medicine, then found use in industrial applications, and are today widely used in failure analysis of manufactured medical devices, electronics, packaging and assembly of printed circuit boards, etc. Some of the techniques that can be used for NDT include radiography, laminography, computed tomography, limited angle tomography, and computed laminography; they can be of assistance in the determination of voids/porosity, flaws, cracks, and inclusions within manufactured parts from the electronics industry. According to a recent report produced by the market research company and consulting firm Research and Market™, the global market for industrial X-ray inspection technologies (CT, radiography, and film-based systems) is estimated to exceed the US$722.4 million by 2024 [2]. As the global manufacturing industry continues to grow and require top tier safety and quality standards, X-ray technologies and techniques provide the visualization and metrology analysis necessary to meet those demands. In this paper, the authors discuss modern 2D & 3D X-ray based approaches for testing and failure analysis, and describe how these different methods have practical application for failure analysis and dimensional metrology.
Modern 2D and 3D X-ray technologies are among the most useful non-destructive testing (NDT) methods that enable the inspection of an object’s internal features without cutting or disassembling the sample. The discovery of X-rays (Röntgen, 1895) marked a revolution that led to major advances in the fields of physics and medicine. Several X-ray based technologies began in medicine, then found use in industrial applications, and are today widely used in failure analysis of manufactured medical devices, electronics, packaging and assembly of printed circuit boards, etc. Some of the techniques that can be used for NDT include radiography, laminography, computed tomography, limited angle tomography, and computed laminography; they can be of assistance in the determination of voids/porosity, flaws, cracks, and inclusions within manufactured parts from the electronics industry. According to a recent report produced by the market research company and consulting firm Research and Market™, the global market for industrial X-ray inspection technologies (CT, radiography, and film-based systems) is estimated to exceed the US$722.4 million by 2024 [2]. As the global manufacturing industry continues to grow and require top tier safety and quality standards, X-ray technologies and techniques provide the visualization and metrology analysis necessary to meet those demands. In this paper, the authors discuss modern 2D & 3D X-ray based approaches for testing and failure analysis, and describe how these different methods have practical application for failure analysis and dimensional metrology.