3D Device Failure Analysis - POSTER

Wednesday, November 13, 2019: 2:30 PM-4:30 PM
Exhibit Hall D (Oregon Convention Center)
3D Device Failure Analysis - POSTER Dr. Christian Schmidt, Nvidia and Kristofor Dickson, NXP
Modern 2D & 3D X-ray technologies for testing and failure analysis
Dr. Herminso Villaraga-Gómez, Nikon Metrology, Inc; Mr. Joshua Bell, Master in Physics, Nikon Metrology, Inc
See more of: Technical Program
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