Infrared Lock-In Thermography: from localization of low power and masked defects to absolute temperature mapping for product debug

Thursday, November 14, 2019: 9:25 AM
D 137/138 (Oregon Convention Center)
Dr. Jeroen Jalink , NXP Semiconductors, Nijmegen, Netherlands
Dr. Abdellatif Firiti , NXP Semiconductors, Nijmegen, Netherlands
Mr. John van den Biggelaar , NXP Semiconductors, Nijmegen, Netherlands
Dr. Antoine Reverdy , IMS laboratory, University of Bordeaux, Talence, France
Mr. Brian Lai , Thermo Fisher Scientific, Fremont, CA
Mr. Dan Bodoh , NXP Semiconductors, Austin, TX

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