FA Processes Case Studies

Thursday, November 14, 2019: 9:25 AM-9:50 AM

D 137/138 (Oregon Convention Center)

Dr. CHUAN ZHANG, NVIDIA and Dr. ERWIN HENDARTO, Silicon Labs

9:25 AM

Infrared Lock-In Thermography: from localization of low power and masked defects to absolute temperature mapping for product debug
Dr. Jeroen Jalink, NXP Semiconductors; Dr. Abdellatif Firiti, NXP Semiconductors; Mr. John van den Biggelaar, NXP Semiconductors; Dr. Antoine Reverdy, IMS laboratory, University of Bordeaux; Mr. Brian Lai, Thermo Fisher Scientific; Mr. Dan Bodoh, NXP Semiconductors

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