Utilizing Delta IDDQ to Screen Cell Specific Defects for High Quality and Reliability Applications

Thursday, November 14, 2019: 3:20 PM
F 150/151 (Oregon Convention Center)
Mr. Eric Barbian , ON Semiconductor, Phoenix, AZ
Mr. Niel Sanico , ON Semiconductor, Phoenix, AZ
Mr. Julien Thiefain , ON Semiconductor, Phoenix, AZ
Mr. Andy Koestner , ON Semiconductor, Phoenix, AZ

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