Case Studies On Application Of Electro Optical Probing (EOP) - A Noninvasive Backside Localization Technique in Failure Analysis

Thursday, November 14, 2019: 10:25 AM
D 137/138 (Oregon Convention Center)
Dr. Srinath Rajaram , On Semiconductor, Phoenix, AZ
Mr. Raj Kabadi , On Semiconductor, Phoenix, AZ
Mr. Eric Barbian , On Semiconductor, Phoenix, AZ

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