FA Processes Case Studies II

Thursday, November 14, 2019: 10:25 AM-12:05 PM

D 137/138 (Oregon Convention Center)

Dr. Chuan Zhang, NVIDIA and Dr. Erwin Hendarto, Silicon Labs

10:25 AM

Case Studies On Application Of Electro Optical Probing (EOP) - A Noninvasive Backside Localization Technique in Failure Analysis
Dr. Srinath Rajaram, On Semiconductor; Mr. Raj Kabadi, On Semiconductor; Mr. Eric Barbian, On Semiconductor

10:50 AM

Understanding Water Ingress in Scanning Acoustic Microscopy and a Method to Observe Defects that are Open to the Surface
Mr. Roger M. Devaney, BS Metallurgical Engineering, Hi-Rel Laboratories, Inc.; Mr. Adam Benak, Hi-Rel Laboratories, Inc.

11:15 AM

A Novel Approach on Fractography thru Infrared Microscopy
Mr. Allan Norico, On-semiconductor; Mr. Rommel Estores, ON Semiconductor

See more of: Technical Program