Non-Destructive Short Fault Localization in Advanced IC Packages Using Electro Optical Terahertz Pulse Reflectometry

Monday, November 11, 2019: 2:25 PM
F 150/151 (Oregon Convention Center)
Dr. Jesse Alton , TeraView Limited, Cambridge, United Kingdom
Ms. Bernice Zee , Advanced Micro Devices (AMD), Singapore, Singapore
Ms. Wen Qiu , Advanced Micro Devices (AMD), Singapore, Singapore
Dr. Thomas White , TeraView Limited, Cambridge, United Kingdom
Mr. Martin Igarashi , TeraView Limited, Cambridge, United Kingdom

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