Understanding Water Ingress in Scanning Acoustic Microscopy and a Method to Observe Defects that are Open to the Surface

Thursday, November 14, 2019: 10:50 AM
D 137/138 (Oregon Convention Center)
Mr. Roger M. Devaney, BS Metallurgical Engineering , Hi-Rel Laboratories, Inc., Spokane, WA
Mr. Adam Benak , Hi-Rel Laboratories, Inc., Spokane, WA

Summary:

Scanning Acoustic Microscopy (SAM) is an important technique in the qualification and failure analysis of molded plastic components. Defects that are open to the device surface can be masked by water ingress which makes them invisible. This paper will present case studies of this phenomenon and a method to properly observe them.