Efficient fault isolation and failure analysis methods to root cause defects in microprocessors

Tuesday, November 12, 2019: 3:45 PM
D 137/138 (Oregon Convention Center)
Dr. Hasan Faraby , Intel Corporation, Hillsboro, OR
Dr. Tristan Deborde , Intel Corporation, Hillsboro, OR
Dr. Martin Von Haartman , Intel Corporation, Hillsboro, OR

See more of: Nanoprobing and Electrical Characterization III
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