The Potential of Inline Automated Defect Review of Mechanical Property and Electrical Characterization by AFM

Wednesday, November 13, 2019
Exhibit Hall D (Oregon Convention Center)
Dr. Sang-Joon Cho , Park Systems Corp, Suwon, Korea, Republic of (South)
Dr. Seong-Oh Kim , Park Systems Corp, Suwon, Korea, Republic of (South)
Mr. Moses Lee , Park Systems Corp, Suwon, Korea, Republic of (South)
Mrs. Yun-Kyung Lee , Park Systems Corp, Suwon, Korea, Republic of (South)

Summary:

It is well known that AFM can measure not only surface morphology but also mechanical and electrical properties. However, the versatility of AFM is not fully utilized in industrial applications due to the various limitations. The potential of inline AFM automated defect review process will be introduced with solutions and examples.