Scanning Probing Analysis - POSTERS

Wednesday, November 13, 2019: 2:30 PM-4:30 PM
Exhibit Hall D (Oregon Convention Center)
Scanning Probing Analysis - POSTERS Mr. Phil Kaszuba, Globalfoundries and Dr. Pai Tangyunyong, Sandia National Laboratories
2D Carrier Density Mapping of SiC Power MOSFET using SNDM-dC/dV and dC/dz Imaging
Dr. Jing-Jiang Yu, Hitachi High Technologies America, Inc.; Dr. Takehiro Yamaoka, Hitachi High-Technologies; Mr. Toru Aiso, Hitachi High-Technologies; Mr. Kazutoshi Watanabe, Hitachi High-Tech Science Corporation; Mr. Yoshiteru Shikakura, Hitachi High-Tech Science Corporation; Mr. Shinya Kudo, Hitachi High-Tech Science Corporation; Mr. Keita Tamura, Hitachi High-Technologies; Mr. Katsunori Mizuguchi, Hitachi High-Technologies
The Potential of Inline Automated Defect Review of Mechanical Property and Electrical Characterization by AFM
Dr. Sang-Joon Cho, Park Systems Corp; Dr. Seong-Oh Kim, Park Systems Corp; Mr. Moses Lee, Park Systems Corp; Mrs. Yun-Kyung Lee, Park Systems Corp
Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy
Prof. Kohei Yamasue, Tohoku University; Prof. Yasuo Cho, Tohoku University
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