A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Increase the ATPG Diagnostic Resolution in Localizing Faults
A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Increase the ATPG Diagnostic Resolution in Localizing Faults
Thursday, November 14, 2019: 2:30 PM
F 150/151 (Oregon Convention Center)
Summary:
This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to increase the ATPG diagnostic resolution in localizing faults. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through targeted fault injection and fault simulations was performed. From the results, further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) faults for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.
This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to increase the ATPG diagnostic resolution in localizing faults. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through targeted fault injection and fault simulations was performed. From the results, further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) faults for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.