Microscopy - POSTERS

Wednesday, November 13, 2019: 2:30 PM-4:30 PM
Exhibit Hall D (Oregon Convention Center)
Microscopy - POSTERS Dr. Lianfeng Fu, Lam Research Corporation and Mr. Ryan Fredrickson, On Semiconductor
High throughput and multiple length scale sample preparation for characterization and failure analysis of advanced semiconductor devices
Dr. Cecile S. Bonifacio, E.A. Fischione Instruments Inc.; Dr. Pawel Nowakowski, E.A. Fischione Instruments, Inc.; Dr. Clive Downing, Trinity College Dublin; Ms. Mary Ray, E.A. Fischione Instruments, Inc.; Mr. Paul Fischione, E.A. Fischione Instruments, Inc.
New paradigm for EBIC amplifier on plasma FIB
Mr. Valerio Sanna Valle, University of Cagliari; Mr. Guy Perez, Centre National d'Etudes Spatiales (CNES); Dr. Guillaume Bascoul, Centre National d'Etudes Spatiales (CNES); Helene Chauvin, Thales; Benoit Viallet, Institut National des Sciences Appliquées; Giovanna Mura, University of Cagliari; Gian Paolo Apeddu, University of Cagliari; Ms. Morgane Mousnier, Centre National d'Etudes Spatiales (CNES)
Super XHR Cross-Sectional SEM Imaging & EDS Analysis: A Systematic Method for High-Fidelity Microstructure Characterization of Dense SRAM FinFET Structures
Mr. Zdenek Kral, Thermo Fisher Scientific; Mr. Jake Jensen, Thermo Fisher Scientific; Mrs. Lisa McGill, Thermo Fisher Scientific; Mr. Trevan Landin, Thermo Fisher Scientific; Mr. Stephen M. Seddio, Thermo Fisher Scientific; Mr. Chris Stephens, Thermo Fisher Scientific; Mr. Roger Alvis, Thermo Fisher Scientific
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