45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
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Flip Chip and Backside Preparation Techniques
Sunday, November 10, 2019: 9:00 AM
D 137/138 (Oregon Convention Center)
Dr. Edward I. Cole Jr., FASM
,
Sandia National Laboratories, Albuquerque, NM
Kira L. Fishgrab
,
Sandia National Laboratories, Albuquerque, NM
Dr. Daniel L. Barton
,
Sandia National Labs, Albuquerque, NM
Dr. Karoline Bernhard-Hofer
,
Infineon, Regensburg, Germany
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Package and Physical Analysis Challenges
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