45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
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Yield Basics for Failure Analysts
Sunday, November 10, 2019: 10:20 AM
F 150 (Oregon Convention Center)
Mr. David Albert
,
IBM, Hopewell Junction, NY
Mr. Tracy Myers
,
ON Semiconductor, Gresham, OR
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