Electrical and Yield

Sunday, November 10, 2019: 8:00 AM-11:50 AM
F 150 (Oregon Convention Center)
Mr. Yan Li, Intel and Greg Johnson, ZEISS
8:00 AM
The Fundamentals of Nanoprobe Analysis
Mr. Randal E. Mulder, Silicon Labs
9:00 AM
FI Techniques for Yield Acceleration: Foundry Perspective
Dr. SH Goh, GLOBALFOUNDRIES Singapore Pte Ltd
10:00 AM
Morning Refreshment Break
10:20 AM
Yield Basics for Failure Analysts
Mr. David Albert, IBM; Mr. Tracy Myers, ON Semiconductor
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