45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
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Defect Localization by Lock-In-Thermography
Sunday, November 10, 2019: 8:00 AM
F 151 (Oregon Convention Center)
Dr. Sebastian Brand
,
Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Germany
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Fault Isolation
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